Scanning probe microscopy ( spm ) related surface science and nanotechnology 與掃描探針有關的表面科學和納米技術
Scanning probe microscopy ( spm ) has evolved into a powerful tool for imaging with nanometer - scale resolution and analyzing a variety of surface in the past two decades , which is advantageous to be done in vacuum , in atmosphere , or in liquid 掃描探針顯微鏡( spm )是近二十年來發(fā)展起來的一個強有力的表面分析工具,具有納米級的分辨率、制樣簡單、可在不同的環(huán)境下(真空、大氣、液體)進行觀察等優(yōu)點。
The branches of nano - technology include nano - physics , nano - chemistry , nano - electronics , nano - material science , nano - biology , nano - mechanics and narto - measurements , etc . with the development of nano - technology , scanning probe microscopy ( spm ) , especially atomic force microscopy ( afm ) , has been the most widely demanded and applied tools for researchers to pursue more ambitious goals , and has actually become the indispensable instruments for nano - scientists and engineers 納米技術正在不斷滲透到現(xiàn)代科學技術的各個領域,形成了許許多多與納米技術相關的新興學科,如納米物理學、納米化學、納米電子學、納米材料學、納米生物學、納米機械學與納米量測學等。掃描隧道顯微鏡( stm )與原子力顯微鏡( afm )等是納米技術發(fā)展的重要基礎,也是納米科技工作者必不可少的研究工具,其中又以afm需求更大,應用領域更為廣泛。